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1

Using Statistical Process Control to Monitor Active Managers

Philips, Thomas K, Yashchin, Emmanuel, Stein, David M

Journal:

The Journal of Portfolio Management

Year:

2003

Language:

english

File:

PDF, 145 KB

english, 2003

2

Parametric Estimation for Window Censored Recurrence Data

Zhu, Yada, Yashchin, Emmanuel, Hosking, J. R. M.

Journal:

Year:

2014

Language:

english

File:

PDF, 568 KB

english, 2014

3

Application of three-parameter lognormal distribution in EM data analysis

Baozhen Li, Emmanuel Yashchin, Cathryn Christiansen, Jason Gill, Ronald Filippi, Timothy Sullivan

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 565 KB

english, 2006

4

Parametric Modeling for Survival with Competing Risks and Masked Failure Causes

Betty J. Flehinger, Benjamin Reiser, Emmanuel Yashchin

Journal:

Lifetime Data Analysis

Year:

2002

Language:

english

File:

PDF, 186 KB

english, 2002

5

Special issue on statistics in quality, industry, and technology

William F. Guthrie, Emmanuel Yashchin

Journal:

Applied Stochastic Models in Business and Industry

Year:

2012

Language:

english

File:

PDF, 30 KB

english, 2012

6

The physical design of on-chip interconnections

Wisniewski, M.Y.L., Yashchin, E., Franch, R.L., Conrady, D.P., Maynard, D.N., Fiorenza, G., Noyan, I.C.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2003

Language:

english

File:

PDF, 3.98 MB

english, 2003

7

Yashchin, Emmanuel

Journal:

IBM Journal of Research and Development

Year:

1985

Language:

english

File:

PDF, 1.28 MB

english, 1985

8

Modeling and Forecasting of Defect-Limited Yield in Semiconductor Manufacturing

Baron, Michael, Takken, Asya, Yashchin, Emmanuel, Lanzerotti, Mary

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2008

Language:

english

File:

PDF, 476 KB

english, 2008

9

Special Issue on Statistics in Quality Control

Michelson, Diane, Yashchin, Emmanuel

Journal:

Applied Stochastic Models in Business and Industry

Year:

2016

Language:

english

File:

PDF, 39 KB

english, 2016

10

Discussion of “Scaling-up process characterization”

Woodall, William H., Kodali, Lata, Yashchin, Emmanuel

Journal:

Quality Engineering

Year:

2018

Language:

english

File:

PDF, 996 KB

english, 2018

11

Process Control and Statistical Inference

Crowder, Stephen V., Hawkins, Douglas M., Reynolds, Marion R., Yashchin, Emmanuel

Journal:

Journal of Quality Technology

Year:

1997

Language:

english

File:

PDF, 755 KB

english, 1997

12

Foreword: Special issue on statistics in business and industry

Etchegaray Garcia, Beatriz E., Novak, Julie E., Yashchin, Emmanuel

Journal:

Applied Stochastic Models in Business and Industry

Year:

2018

Language:

english

File:

PDF, 92 KB

english, 2018

13

Gradient analysis of Markov-type control schemes and its applications

Yashchin, Emmanuel

Journal:

Communications in Statistics - Simulation and Computation

Year:

2019

File:

PDF, 1.79 MB

2019

14

Growth and domain structure of potassium titanyl phosphate crystals pulled from high-temperature solutions

N. Angert, L. Kaplun, M. Tseitlin, E. Yashchin, M. Roth

Journal:

Journal of Crystal Growth

Year:

1994

Language:

english

File:

PDF, 581 KB

english, 1994

15

Asymptotic behaviour of integral functions connected with an infinite convolution of exponential densities for small values of the argument

Paul D Feigin, Emmanuel Yashchin

Journal:

Journal of Mathematical Analysis and Applications

Year:

1982

Language:

english

File:

PDF, 251 KB

english, 1982

16

Evolution of core connectivity in MgB2 wires and tapes during PIT processing

V. Beilin, E. Dul'kin, E. Yashchin, E. Galstyan, Y. Lapides, M. Tsindlekht, I. Felner, M. Roth

Journal:

Physica C: Superconductivity

Year:

2004

Language:

english

File:

PDF, 1.13 MB

english, 2004

17

Change-point models in industrial applications

Emmanuel Yashchin

Journal:

Nonlinear Analysis: Theory, Methods & Applications

Year:

1997

Language:

english

File:

PDF, 782 KB

english, 1997

18

Statistical inference for masked data

Benjamin Reiser, Emmanuel Yashchin, Betty J. Flehinger

Journal:

Nonlinear Analysis: Theory, Methods & Applications

Year:

1997

Language:

english

File:

PDF, 440 KB

english, 1997

19

Critical current anisotropy in non-sintered metal-clad MgB2 tapes

V Beilin, I Felner, E Yashchin, E Dul'kin, M Roth, I Lapides, A Verdyan

Journal:

Physica C: Superconductivity

Year:

2002

Language:

english

File:

PDF, 698 KB

english, 2002

20

Effects of deformation on current-limiting factors in Ag/BiSCCO tapes

V. Beilin, A. Goldgirsh, E. Yashchin, M. Roth, M. Schieber

Journal:

Physica C: Superconductivity

Year:

1998

Language:

english

File:

PDF, 337 KB

english, 1998

21

On a strong Tauberian result

Paul D. Feigin, Emmanuel Yashchin

Journal:

Probability Theory and Related Fields

Year:

1983

Language:

english

File:

PDF, 546 KB

english, 1983

22

An algorithm for blob hierarchy layout

David Harel, Gregory Yashchin

Journal:

The Visual Computer

Year:

2002

Language:

english

File:

PDF, 260 KB

english, 2002

23

Magnetic properties of sintered and deformed Ag/BiSCCO tapes

A. Goldgirsh, V. Beilin, E. Yashchin, I. Felner, M. Schieber

Journal:

Physica C: Superconductivity

Year:

1997

Language:

english

File:

PDF, 195 KB

english, 1997

24

The process of a Bi-2223/Ag ribbon sintering studied by the method of acoustic emission

E. Dul’kin, V. Beilin, E. Yashchin, M. Roth, L. V. Grebenkina

Journal:

Technical Physics Letters

Year:

2001

Language:

english

File:

PDF, 28 KB

english, 2001

25

Straining of a Bi-2223/Ag ribbon studied by the method of acoustic emission

E. Dul’kin, V. Beilin, E. Yashchin, M. Roth, L. V. Grebenkina

Journal:

Technical Physics Letters

Year:

2002

Language:

english

File:

PDF, 27 KB

english, 2002

26

Threshold electromigration failure time and its statistics for Cu interconnects

Li, Baozhen, Christiansen, Cathryn, Gill, Jason, Sullivan, Timothy, Yashchin, Emmanuel, Filippi, Ronald

Journal:

Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 1.08 MB

english, 2006

27

Some aspects of the theory of statistical control schemes

Yashchin, Emmanuel

Journal:

IBM Journal of Research and Development

Year:

1987

Language:

english

File:

PDF, 705 KB

english, 1987

28

Selected Topics in Ultra-Low Emissivity Alpha-Particle Detection

Gordon, Michael S., Rodbell, Kenneth P., Tang, Henry H.K., Yashchin, Emmanuel, Cascio, Ethan W., McNally, Brendan D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.61 MB

english, 2013

29

Survival with Competing Risks and Masked Causes of Failures

Betty J. Flehinger, Benjamin Reiser and Emmanuel Yashchin

Journal:

Year:

1998

Language:

english

File:

PDF, 1.10 MB

english, 1998

30

Special Issue on Statistics in Industry || Statistical Control Schemes: Methods, Applications and Generalizations

Emmanuel Yashchin

Journal:

International Statistical Review

Year:

1993

Language:

english

File:

PDF, 3.26 MB

english, 1993

31

Change-Point Problems || Likelihood Ratio Methods for Monitoring Parameters of a Nested Random Effect Model

Emmanuel Yashchin

Journal:

IMS Lecture Notes--Monograph Series

Year:

1994

Language:

english

File:

PDF, 1.23 MB

english, 1994

32

On a Unified Approach to the Analysis of Two-Sided Cumulative Sum Control Schemes with Headstarts

Emmanuel Yashchin

Journal:

Advances in Applied Probability

Year:

1985

Language:

english

File:

PDF, 2.57 MB

english, 1985

33

Statistical Modeling.by Warren Gilchrist

Review by: Emmanuel Yashchin

Journal:

Journal of the American Statistical Association

Year:

1987

Language:

english

File:

PDF, 275 KB

english, 1987

34

Likelihood Ratio Methods for Monitoring Parameters of a Nested Random Effect Model

Emmanuel Yashchin

Journal:

Journal of the American Statistical Association

Year:

1995

Language:

english

File:

PDF, 1.44 MB

english, 1995

35

Cost (Or Price) Forecasting in the Face of Technological Advance

David A. Harville and Emmanuel Yashchin

Journal:

Journal of the American Statistical Association

Year:

2007

Language:

english

File:

PDF, 2.33 MB

english, 2007

36

Modeling of risk losses using size-biased data

Journal:

IBM Journal of Research and Development

Year:

2007

Language:

english

File:

PDF, 278 KB

english, 2007

37

Cost (or Price) Forecasting in the Face of Technological Advance

Harville, David A, Yashchin, Emmanuel

Journal:

Journal of the American Statistical Association

Year:

2007

Language:

english

File:

PDF, 450 KB

english, 2007

38

Estimating the efficiency of collaborative problem-solving, with applications to chip design

Wisniewski, M. Y. L., Yashchin, E., Franch, R. L., Conrady, D. P., Fiorenza, G., Noyan, I. C.

Journal:

IBM Journal of Research and Development

Year:

2003

Language:

english

File:

PDF, 135 KB

english, 2003

39

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Min-log approach to modeling dielectric breakdown data

Yashchin, Emmanuel, Baozhen Li,, Stathis, James, Wu, Ernest

Year:

2012

Language:

english

File:

PDF, 378 KB

english, 2012

40

Fast healing of deformation-induced damage in Ag/Bi-2223 tapes

Polyanskii, A., Beilin, V.M., Yashchin, E., Goldgirsh, A., Roth, M., Larbalestier, D.

Journal:

IEEE Transactions on Appiled Superconductivity

Year:

2001

Language:

english

File:

PDF, 837 KB

english, 2001

41

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Minimum Void Size and 3-Parameter Lognormal Distribution for EM Failures in Cu Interconnects

Li, Baozhen, Christiansen, Cathryn, Gill, Jason, Filippi, Ronald, Sullivan, Timothy, Yashchin, Emmanuel

Year:

2006

Language:

english

File:

PDF, 486 KB

english, 2006

42

Ferroelectric phase transition temperatures of KTiOPO4 crystals grown from self-fluxes

Angert, N., Tseitlin, M., Yashchin, E., Roth, M.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 308 KB

english, 1995

43

Effects of intermediate deformation and thermal processing in the OPIT process upon critical current density of Ag/BiSSCO tapes

Beilin, V., Goldgirsh, A., Yashchin, E., Roth, M., Schieber, M.

Journal:

IEEE Transactions on Appiled Superconductivity

Year:

1999

Language:

english

File:

PDF, 343 KB

english, 1999

44

Estimating the Current Mean of a Process Subject to Abrupt Changes

Yashchin, Emmanuel

Journal:

Year:

1995

Language:

english

File:

PDF, 1.30 MB

english, 1995

45

[IEEE ICASSP 2011 - 2011 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) - Prague, Czech Republic (2011.05.22-2011.05.27)] 2011 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) - Defining the controlling parameter in constrained discriminative linear transform for supervised speaker adaptation

Jiang, Danning, Kanevsky, Dimitri, Yashchin, Emmanuel, Qin, Yong

Year:

2011

Language:

english

File:

PDF, 180 KB

english, 2011

46

[IEEE ICASSP 2008 - 2008 IEEE International Conference on Acoustics, Speech and Signal Processing - Las Vegas, NV, USA (2008.03.31-2008.04.4)] 2008 IEEE International Conference on Acoustics, Speech and Signal Processing - Accelerated Monte Carlo for Kullback-Leibler divergence between Gaussian mixture models

Jia-Yu Chen,, Hershey, John R., Olsen, Peder A., Yashchin, Emmanuel

Year:

2008

Language:

english

File:

PDF, 211 KB

english, 2008

47

[IEEE International Conference on Acoustics, Speech, and Signal Processing - Glasgow, UK (23-26 May 1989)] International Conference on Acoustics, Speech, and Signal Processing - Performance of speech recognition devices: evaluating speech produced over the telephone network

Yashchin, D., Basson, S., Lauritzen, N., Levas, S., Loring, A., Rubin-Spitz, J.

Year:

1989

Language:

english

File:

PDF, 394 KB

english, 1989

48

Inference About Defects in the Presence of Masking

Flehinger, Betty J., Reiser, Benjamin, Yashchin, Emmanuel

Journal:

Year:

1996

Language:

english

File:

PDF, 897 KB

english, 1996

49

Performance of CUSUM Control Schemes for Serially Correlated Observations

Yashchin, Emmanuel

Journal:

Year:

1993

Language:

english

File:

PDF, 1.68 MB

english, 1993

50

Likelihood Ratio Methods for Monitoring Parameters of a Nested Random Effect Model

Yashchin, Emmanuel

Journal:

Journal of the American Statistical Association

Year:

1995

Language:

english

File:

PDF, 1.01 MB

english, 1995